Measurements of the dynamic magnetic susceptibility χ as a function of temperature were made on polycrystalline semimagnetic semiconductor Cd1-xMnxSe (x = 0.1, 0.2 and 0.3). The magnetic susceptibility was investigated in the temperature range of 5-200K revealing the paramagnetic behavior described by the Curie-Weiss law and indicating the presence of antiferromagnetic exchange interactions between Mn ions. The 1/ χm versus T curves indicates that for x=0.1 the behavior was a mixture of antiferromagnetic and spin-glass while for x = 0.2 and 0.3 shows spin-glass form. The temperature dependence of the EPR spectra for the investigated samples was measured in the temperature range 4 to 300k. The obtained g-factor of the investigated samples shows slight decrease with increasing the concentration of Mn. The calculated number of defects illustrates that increasing the temperature leads to an increase in the number of defects increases.
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